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Daniel Yap, Kim Sing Wong, Luc Petit, Roberto Antonicelli, Seung Wook Yoon
2017 IEEE 67th Electronic Components and Technology Conference
Reliability of eWLB (Embedded Wafer Level BGA) for Automotive Radar Applications
2017-04-28T14:16:39-07:00
2017-06-14T15:56:56-06:00
2017-06-14T15:56:56-06:00
FOWLP, eWLB, Automotive packaging, 77GHz ADAS packaging, Reliablity, Failure Analysis
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